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From: Stefanos Sidiropoulos (stefanos AT rambus DOT com)
Date: Wed Apr 05 2000 - 13:26:26 EDT


At 08:15 AM 4/5/00 , you wrote:

>well, i believe that each metal layer *must* be on it's own plane, so
>the issue is contacts to metal.  the new techfiles have both
>traditional contacts, where each resides on the same plane as the
>metal it connects to (eg. layer 'm2c' resides on the metal2 plane), as
>well as new (named "generic") contacts and vias (gc, gv1, gv2, etc.),
>which do reside on their own plane.  the main need for these is to
>....

If you have specific reasons for that I would not object at all..





>they now have the 225-type limit needed for SCN6M_*.tech27
>
> > 2) There is a bug in the files which they never fixed: nnd connects to 
> pdiff
> >       and ppd connects to ndiff. In real silicon this is a zener diode but
> > given
> >       these techfiles magic treats it as a perfect short.
>
>believe me, since i learned this first hand (read that, chip failure),
>the "diode" between ohmic and diffusion *is* a short in all
>*silicided* processes; silicide is metal put into the diffusions to
>lower the resistance.  it does it so well that in some of HP's
>standard library cells, there're no actual contacts to ohmics which
>abut diffusion (rather the contact to diffusion is enough for both).



Interesting... My counter argument would be that you should not
be using p+/n+ diodes for anything.. Besides I don't know of any
sane person who would want i.e. their clock buffer powered through
silicide. If HP does it in their standard cells I am sure they have
some way of verifying the IR drop and electromigration problems
this creates (otherwise I feel sorry for them). Since however you
don't supply any such tool with your tech file you should not
leave open such a huge methodology hole..

Regards,

-- Stefanos


 
 
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